electron microscopy
 

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RESEARCH: RECENT HIGHLIGHTSEXAMPLES


 

Point Analysis in STEM

In STEM, an electron beam is scanned over a defined area of the sample. The beam can be localized on a certain point in the image and used to measure an EDX and/or EEL spectrum there. Moreover, line scans and mappings can be obtained by this powerful technique.

Example: AuPd Particles on Titanium Oxide


Metal nanoparticles dispersed on titanaia are recognizable in the Z-contrast image as bright patches. To solve the question whether the metal particles consist of an AuPd alloy or of the separated au and Pd nanoparticles, EDXS spot analyses were performed. EDX spectra obtained at the positions marked in the HAADF-STEM image show the characteristic signals of both metals - even for ca. 1 nm nanoparticles (point 2) - and thus prove the presence of an alloy.

Characterization of AuPd Nanoparticles by Probe-Corrected Scanning Transmission Electron Microscopy and X-Ray Absorption Spectroscopy
F. Krumeich, S. Marx, A. Baiker, R. Nesper, Z. anorg. allg. Chem. 637 (2011) 875-881 DOI

 

ETH Zürich | ETH chemistry department | ETH inorganic chemistry

modified: 6 February, 2015 by F. Krumeich | © ETH Zürich and the authors