electron microscopy



Transmission Electron Microscopy (TEM)

Utilized signals: elastically scattered electrons - direct beam and diffracted beams

Methods Information
BF/DF-TEM Detection of crystalline areas, defects and grain boundaries, phase analysis, particle size
HRTEM Direct visualisation of structures and defects
EFTEM Zero-loss filtering
ED Determination of lattice parameter and crystal symmetry, crystal orientation, phase analysis

A main advantageous characteristic of a transmission electron microscope is the possibility to obtain information in real space (imaging mode) and reciprocal space (diffraction mode) almost simultaneously.

An introduction into the function principles of a TEM with animations can be found on Goodhew's Matter page and into theory and practice of TEM on the web site of Rodenburg.

The potential of HRTEM in combination with electron diffraction for structure determination is demonstrated on example of a new Zr/Nb/W oxide.


ETH Zürich | ETH chemistry department | ETH inorganic chemistry

modified: 5 January, 2016 by F. Krumeich | © ETH Zürich and the authors