electron microscopy
 

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RESEARCH: RECENT HIGHLIGHTSEXAMPLES


 

SEM: Imaging with Secondary Electrons

Imaging with secondary electrons provides information about morphology and surface topography. The contrast is dominated by the so-called edge effect: more secondary electron can leave the sample at edges than in flat areas leading to increased brightness there (see scheme).

 


 
ETH Zürich | ETH chemistry department | ETH inorganic chemistry

modified: 5 January, 2018 by F. Krumeich | © ETH Zürich and the authors