electron microscopy
 

HOMEMETHODSINTERACTIONSDOWNLOADSCONTACT
RESEARCH: RECENT HIGHLIGHTSEXAMPLES


 

SEM: Imaging with Secondary Electrons

 

The SEM images were obtained with a LEO 1530 Gemini operated at low voltage (1 keV).

 


MOF crystals (sample: D. Jiang, A.Baiker)

 

Nano cups on graphite (sample: M. Spahr, Timcal)
 


Vanadium oxide nanotubes

 


SI/Ge towers on prestructured silicon (sample: E. Müller)

 


Zeolithe crystals (sample: N. Danilina, J. van Bokhoven)

 
ETH Zürich | ETH chemistry department | ETH inorganic chemistry

modified: 6 February, 2015 by F. Krumeich | © ETH Zürich and the authors