electron microscopy
 

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Scanning Electron Microscopy (SEM)

In a scanning electron microscope, a tiny electron beam is focussed onto the sample. Simultaneous to scanning the beam across a selected sample area, generated signals are being recorded and thereby an image is formed pixel by pixel. In contrast to TEM methods needing very thin samples (cf. STEM, using transmitted electrons), compact samples can thus be investigated by SEM. Valuable information about morphology, surface topology and composition can be obtained. SEM microscopes achieving resolutions below 1 nm are available now.


Schematic representation of a SEM

SE detectors | SE imaging |SEM images | Dependence on voltage

If you like to play around a bit, there are virtual SEMs on the net (SEM). An introduction can be found here (SEM-Primer.pdf).

ETH Zürich | ETH chemistry department | ETH inorganic chemistry

modified: 11 January, 2017 by F. Krumeich | © ETH Zürich and the authors