Aim
of this Website
Since
the first transmission electron microscope
was built in 1931, much progress has been made in improving instruments
and methods for exploring the micro and the nano world. Today, electron
microscopy comprises a wide range of different methods that use
the various signals arising from the interaction
of the electron beam with the sample
to obtain information about structure, morphology and composition.
The goal of this site is to explain the basics of most electron
microscopy methods in a qualitative way, i. e. without giving much insight into the complex theory
and mathematics that underlie them. Thus, reading these pages can in no way
substitute the study of textbooks.
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How
to find a solution to your problem
The method that is needed is determined by
the question to be solved: |
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Structure |
- (High-Resolution)
Transmission Electron Microscopy ((HR)TEM)
- Scanning
Transmission Electron Microscopy (STEM)
- Electron
diffraction (ED)
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Composition |
- Energy-dispersive
X-ray spectroscopy (EDXS)
- Electron
Energy Loss Spectroscopy (EELS)
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Morphology |
- Scanning
Electron Microscopy (SEM)
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Elemental
mapping
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Electron
Microscopy at ETH Zurich
Of
course, not all investigations can be done with just one microscope.
Because of that, there is a pool of different electron
microscopes at the ETH Zurich hosted by the Scientific Center for Optical and Electron Microscopy (ScopeM) which is located at the Campus Hönggerberg. ScopeM also offers TEM and SEM practical training courses. A comprehensive introduction into theory and application of electron microscopy is given each fall term in the lecture series Electron Microscopy in Materials Science.
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Further
information
Of
course, only a rudimentary description of the different electron
microscopy techniques and their physical basics can be provided by this site. If you want to
gain more comprehensive knowledge about the fascinating world of
electron microscopy, there is a lot of information available in printed
form. A script providing a short introduction into TEM and STEM is available here (download pdf-file).
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