signals: elastically scattered
electrons - direct beam and diffracted beams
of crystalline areas, defects and grain boundaries, phase
analysis, particle size
||Direct visualisation of structures and defects
of lattice parameter and crystal symmetry, crystal orientation,
main advantageous characteristic of a transmission
electron microscope is the
possibility to obtain information in real space (imaging mode)
and reciprocal space (diffraction mode) almost simultaneously.
into the function principles of a TEM with
animations can be found on Goodhew's
and into theory and practice of TEM on the web site of Rodenburg.
potential of HRTEM in combination with electron diffraction for
structure determination is demonstrated on example of a new Zr/Nb/W