In
the bright field (BF) mode of the TEM, an aperture is placed in
the back focal plane of the objective lens which allows only the
direct beam to pass. In this case, the image results from a weakening
of the direct beam by its interaction with the sample. Therefore,
mass-thickness and diffraction contrast contribute
to image formation: thick areas, areas in which heavy atoms are
enriched, and crystalline areas appear with dark contrast. It should
be mentioned that the interpretation of images is often impeded
by the simultaneous occurence of the contrast-forming phenomena. |