Simplified
representation of the ray path leading to the first intermediate
image in the image plane of the objective
lens. Electrons, which
come from the condenser system of the TEM, are scattered by the
sample, situated in the object plane of the objective lens. Electrons
scattered in the same direction are focused in the back focal
plane, and, as a result, a diffraction pattern is formed there.
Electrons coming from the same point of the object are focused
in the image plane. In the TEM, the first
intermediate image is magnified by further lenses
(projective
system). |