electron microscopy
 

HOMEMETHODSINTERACTIONSDOWNLOADSCONTACT
RESEARCH: RECENT HIGHLIGHTSEXAMPLES


 

Selected Literature about Electron Microscopy

Books

Analytical Transmission Electron Microscopy - An Introduction for Operators
J. Thomas, T. Gemming, Springer, Berlin, 2014
Analytische Transmissionselektronenmikroskopie: Eine Einführung fuer den Praktiker
J. Thomas, T. Gemming, Springer, Berlin, 2014
A well written treatment of TEM and analytical methods on a student's level. The book is - as claimed in its title - a very suitable introduction for TEM beginners discussing important practical aspects and explaining the necessary theory mostly in a qualitative way.

Transmission Electron Microscopy
D. B. Williams and C. B. Carter, Plenum Press, New York, 1996

Covers all TEM methods, including analytical electron microscopy and electron diffraction. Gives only the basic theory but many hints for practical work. Most useful and highly recommended!

High-Resolution Transmission Electron Microscopy and Associated Techniques
Ed. Buseck, Cowley and Eyring, Oxford University Press, 1988
Many examples from solid state chemistry and materials science.

High-Resolution Electron Microscopy
J. C. H. Spence, Oxford University Press,
3rd Ed., 2003
Comprehensive treatment of HRTEM and related techniques.

Transmission Electron Microscopy
L. Reimer and H. Kohl, Springer, 5th Ed., Berlin,
2007
Revised version of "The Reimer". Comprehensive treatment of theory. For specialists!

Scanning Electron Microscopy and X-Ray Microanalysis
J. Goldstein, D. Newbury, D. Joy, C. Lyman, P. Echlin, E. Lifshin, L. Sawyer, J. Michael

Kluwer Academics/ Plenum Publishers, 3rd Ed., New York, 2003
Comprehensive treatment.

Aberration-Corrected Imaging in Transmission Electron Microscopy
R. Erni, Imperial College Press, 2nd Ed., London, 2015

Very useful introduction into aberration-corrected HRTEM and STEM.

Aberration-Corrected Analytical Transmission Electron Microscopy
R. Brydson (Ed.), John Wiley and Sons, Ltd., Chichester, 2011

Well written introduction into probe-corrected STEM and its applications.

Scanning Transmission Electron Microscopy
S. J. Pennycook, P. D. Nellist (Eds.), Springer, New York, 2011

Comprehensive introduction into probe-corrected STEM including a detailed view on the history of STEM. Many examples of applications in various fields are given by specialists (review by A. Howie).

 

Reviews about Electron Microscopy Methods and their Applications in Solid State Chemistry and Nano Science

High-Resolution Transmission Electron Microscopy

Hochauflösende Durchstrahlungs-Elektronenmikroskopie
R. Gruehn and R. Ross, Chemie in unserer Zeit 21 (1987) 194-206 DOI

Is Science Prepared for Atomic Resolution Electron Microscopy?
K. W. Urban, Nature Mater. 8 (2009) 260-262 DOI

Historical Aspects of Aberration Correction
H. Rose, J. Electron Microsc. 58 (2009) 77–85 DOI

Negative Spherical Aberration Ultrahigh-Resolution Imaging in Corrected Transmission Electron Microscopy
K. W. Urban, C. Jia, L. Houben, M. Lentzen, S. Mi and K. Tillmann, Phil. Trans. R. Soc. A 367 (2009) 3735–3753 DOI

Transmission Electron Microscopy
F. Krumeich, in: Handbook of Solid State Chemistry, Vol. 3: Characterization (Eds. R. Dronskowski, S. Kikkawa, A. Stein), Wiley (Weinheim) 2017, 155-182, DOI

Analytical Electron Microscopy

Quantitative Energy-Filtering Transmission Electron Microscopy in Material Science
W. Grogger, F. Hofer, P. Warbichler, and G. Kothleitner, Microsc. Microanal. 6 (2000) 161-172 DOI

Analytical Transmission Electron Microscopy
W. Sigle, Annu. Rev. Mater. Res. 35 (2005) 239-314 DOI

Electron Energy-Loss Spectroscopy in the TEM
R. F. Egerton, Rep. Prog. Phys. 72 (2009) 016502 (25pp) DOI


Electron Diffraction

Crystallography in the Conventional Electron Microscope: Moving Between Direct and Reciprocal Space
S. Amelinckx, Acta Cryst. B51 (1995) 486-501 DOI

Microdiffraction as a Tool for Crystal Structure Identification and Determination
J. P. Morniroli and J. W. Steeds, Ultramicroscopy 45 (1992) 219-239 DOI

Scanning Transmission Electron Microscopy

Materials Characterization in the Aberration-Corrected Scanning Transmission Electron Microscope
M. Varela, A. R. Lupini, K. van Benthen, A. Y. Borisevich, M. F. Chrisholm, N. Shibata, E. Abe, and S. J. Pennycook, Annu. Rev. Mater. Res. 35 (2005) 539-569 DOI

Aberration-Corrected Scanning Transmission Electron Microscopy: from Atomic Imaging and Analysis to Solving Energy Problems
S. J. Pennycook, M. F. Chisholm, A. R. Lupini, M. Varela, A. Y. Borisevich, M. P. Oxley, W. D. Luo, K. Van Benthem, S.-H. Oh, D. L. Sales, S. I. Molina, J. Garcia-Barriocanal, C. Leon, J. Santamaria, S. N. Rashkeev and S. T. Pantelides, Phil. Trans. R. Soc. A 367 (2009) 3709–3733 DOI


EM in Material Science

New Developments in Transmission Electron Microscopy for Nanotechnology
Z. L. Wang, Adv. Mater. 15 (2003) 1497-1514 DOI

High-Resolution Transmission Electron Microscopy: the Ultimate Nanoanalytical Technique
J. Meurig Thomas and P. A. Midgley, Chem. Commun. (2004) 1253-1267 DOI

Advanced Electron Microscopy Characterization of Nanostructured Heterogeneous Catalysts
J. Liu, Microsc. Microanal. 10 (2004) 55-76 DOI


HRTEM in Solid State Chemistry

High-Resolution Electron Microscopy Reexamined as a Tool in Solid State Chemistry
R. Gruehn and W. Mertin, Angw. Chem. Int. Ed. 19 (1980) 505-520 DOI

High-Resolution Electron Microscopy in Solid State Chemistry
L. Kihlborg, Prog. Solid State Chem. 20 (1990) 101-133 DOI

Advanced Electron Microscopy and its Possibilities to Solve Complex Structures: Application to Transition Metal Oxides
G. Van Tendeloo, J. Hadermann, A. M. Abakumov and E. V. Antipov, J. Mater. Chem. 19 (2009) 2660–2670 DOI

 

ETH Zürich | ETH chemistry department | ETH inorganic chemistry

modified: 20 April, 2020 by F. Krumeich | © ETH Zürich and the authors